Combination of automatic test pattern generation and built-in intermediate voltage sensing for detecting CMOS bridging faults
Kuen-Jong Lee, Jing-Jou Tang, Tsung‐Chu Huang, Cheng-Liang Tsai · 2002
This paper presents the BIFEST, an ATPG system that combines the conventional ATPG process and the built-in intermediate voltage test technique to deal with CMOS bridging faults. A PODEM-like, PPSFP-based ATPG process that can effectively and efficiently model the bridging fault effects is developed to process those faults that are conventionally logic-testable. The remaining faults are then dealt with by special circuits called built-in intermediate voltage sensors. By this methodology almost the same fault coverage as that employing IDDQ testing can be achieved with only logic monitoring required.