Design for testability for mixed analog/digital ASICs
Patrick P. Fasang, david mullins, Teresa Wong · 2003
A description is given of the concept and issues of design for testability for mixed analog-digital circuits, an architecture for testable circuits of this type, general testing procedure, and the concept of analog test tables. The analog test tables contain information such as what parameters are selected for testing, what nodes need to be accessible, and testing conditions.>