Effective edge-corner detection method for defected images
Kwok-Kei Lai, Pengfei Wu · 2002
The locations of junctions, parallelism of lines and inclined angles of lines are difficult to be ascertained but essential in the geometrical transformation into objects from images. A fast and effective edge-corner detection method, named the cellular vectorization method (CVM), is proposed. This method is particularly effective in hand line drawings containing imperfections, such as unattached edges, misaligned junctions, overshoot junctions, and roughly parallel lines. All such defects can be detected and corrected. When in use, the CVM interprets hand line drawings directly and does away with filtering and thinning processes. Thus, the CVM is both a time-saving and versatile method for image detection based on edges and corners data. Experimental results are given to show the correctness and effectiveness of the proposed method.