Towards a standard for embedded core test: an example
Erik Jan Marinissen, Y. Zorian, R. Kapur, Tony R. Taylor, Lee Whetsel · 2003
Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustrates through a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. This paper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects the view of five active participants of the Standardization Committee on its current status.