Built-in self-test for state faults induced by crosstalk in sequential circuits
Kazuya Shimizu, Noriyoshi Itazaki, K. Kinoshita · 2002
With the movement into deep submicron (DSM) technology and GHz clock frequencies, signal integrity problems have become important. Signal integrity problems are induced by circuit noise such as crosstalk, power supply noise. substrate noise. In this paper, we consider crosstalk in such noise and propose a new built-in self-test method for faults induced by crosstalk, called crosstalk faults.