A test pattern generation unit for memory NPSF built-in self test
A. Chrisanthopoulos, George Kamoulakos, Yiorgos E. Tsiatouhas, A. Arpoyanni · 2002
In this paper we present the design of a deterministic Test Pattern Generation (TPG) unit which can be exploited in a Built-In Self-Test (BIST) scheme for memory Neighborhood Pattern Sensitive Fault (NPSF) testing. The proposed TPG generates the required 5-bit Eulerian sequence that is needed for memory Type-1 NPSF testing.