An algorithm for row-column self-repair of RAMs and its implementation in the Alpha 21264
Dilip K. Bhavsar · 2003
An innovative self-test and self-repair technique supports built-in self-test and built-in self-repair of large embedded RAM arrays with spare rows and columns. The technique generates and analyzes the required failure bitmap information on the fly during self-test and then automatically repairs and verifies the repaired RAM arrays.