On-chip deterministic counter-based TPG with low heat dissipation
Xrysovalantis Kavousianos, Dimitrios Nikolos, Spyros Tragoudas · 2003
An on-chip test pattern generation (TPG) scheme for the digital components of a mixed signal system is presented. The TPG is a counter. We propose CAD tools that automate its design so that the heat dissipation during test application is low. Experimental results on the ISCAS'85 benchmarks show the impact of the proposed methods.