A test methodology for interconnect structures of LUT-based FPGAs
Hiroyuki Michinishi, Tokumi Yokohira, Tatsuki Okamoto, Tomoo Inoue, Hideo Fujiwara · 2002
In this paper we consider testing for programmable interconnect structures of look-up table based FPGAs. The interconnect structure considered in the paper consists of interconnecting wires and programmable points (switches) to join them. As fault models, stuck-at faults of the wires, and extra-device faults and missing-device faults of the programmable points are considered. We heuristically derive test procedures for the faults and then show their validness and complexity.