100 MHz IDDQ sensor design with 1 μA resolution for BIST applications
Y. Antonioli, K. Kinoshita, S. Nishikawa, H. Uemura · 2002
This paper presents a high-speed high-resolution I/sub DDQ/ (power supply quiescent current) sensor design for BIST (built-in self test) applications. The voltage drop is amplified before comparison with a reference voltage to improve sensing resolution. For various CUTs (Circuits Under Test) including Iscas circuits, Spice simulations show speeds up to 100 MHz. A resolution better than 1 /spl mu/A is achieved while the voltage drop is kept under 0.3 V.