Built-in self-test for analog circuits in mixed-signal systems
K. Maggard, Charles E. Stroud · 2003
A built-in self-test (BIST) approach is presented which is designed to test the analog portion of mixed-signal systems. The BIST approach is evaluated using fault simulation with analog benchmark circuits and is found to consistently provide high fault coverage of all stuck-open and stuck-short faults in the circuit under test.