On the performance of augmented signature testing
Geetani Edirisooriya, S. Edirisooriya, John P. Robinson · 1993 IEEE International Symposium on Circuits and Systems · 2002
Signature registers are widely used to compact test Data In Built-in Self-test (BIST) environments. Closed form expressions are obtained for aliasing probability in augmented signature testing which uniquely identifies the quotient, under both generalized independent and q-ary symmetric error models for arbitrary test lengths.>