A discrete software reliability growth model with testing effort
P. K. Kapur, Min Xie, Renu Garg, Akanksha Jha · 2002
We propose a discrete software reliability growth model with testing effort. The behaviour of the testing effort is described by a discrete Rayleigh curve. Assuming that the discrete failure intensity to the amount of current testing effort is proportional to the remaining error content, we formulate the model as a non-homogeneous poisson process. Parameters of the model are estimated. We then discuss a release policy based on cost and failure intensity criteria. Numerical results are also presented.