Using VXI to test primary and secondary batteries
K.E. Ames, D.E. Judd, S.L. Girard, S.J. Christensen, B.E. Mosses · 2002
Presented in this paper are VXI (VME extentions for instrumentation) systems configured for high-speed and cycle testing of batteries. Highspeed testing is normally used for short-term primary (nonrechargeable) batteries. Testing of these batteries consists of both high-speed data acquisition and load control. Testing of secondary (rechargeable) batteries is normally long-term cycling. These tests, which may run for years, consist of running continual cycles that are made up of charges and discharges. The VXIbus or simply VXI is an open standard that can be configured for both these applications. VXI promises more choice, better performance and freedom from obsolescence. At the same time, it means changing from conventional "rack and stack" equipment to a new, downsized, modular system. This paper also examines the software needed to run these systems. This includes SCPI (Standard Commands for Programmable Instruments), the command language used in several HP Test and Measurement products, HP BASIC/WS and HPUX (UNIX) used for high-level programming.>