Non-exhaustive parity testing
Shiyi Xu · 2002
In this paper, some new approaches are presented to deal with the dilemma we are facing in using parity testing: (1) proposing a method of turning a parity untestable circuit into parity testable (2) presenting a scheme of replacing the exhaustive testing with nonexhaustive method. The parity testing may resume its position by using some new technologies including the techniques presented.