Analog integrated circuit parameter fault diagnosis using artificial neural network
Jingfan Zhang, Junren Gan, Lin-Sheng Yao · 2002
An artificial neural network method used for analog IC parameter fault diagnosis is presented in this paper. It is fast and accurate. Therefore it has boundless prospects in the field of analog IC parameter fault diagnosis. With the rapid development in IC technology, the fault diagnosis problem of analog IC has become more acute. The traditional methods' computation complexity and inaccuracy of results make most of them still unacceptable. We therefore research and develop an artificial neural network system to resolving the low velocity and low measurability problem of the traditional methods.