Analysis of software process improvement experience using the project visibility index
Keishi Sakamoto, Naoki Niihara, Toshifumi Tanaka, Kumiyo Nakakoji, K. Kishida · 2002
Based on the capability maturity model (CMM), process improvement at OMRON, a Japanese microprocessor manufacturer, increased project predictability in three ways: accuracy, variability, and performance. The authors use the project visibility index (PVI) and other measurements to quantitatively demonstrate this. Qualitative analysis of how and why OMRON achieved higher project visibility and increases in the QCD (quality, cost, and delivery on time) factors are supported with data on review-effort ratios and productivity. They identify factors directly affected by high project visibility.