Mixed-signal circuit testing-A review
Chin‐Long Wey · 2002
Testing and fault diagnosis are two important aspects in the design and maintenance of mixed-signal circuits. To enhance testability and fault diagnosability, both design-for-testability (DFT) and built-in self-test (BIST) techniques have been successfully developed for digital circuits. This paper reviews the development of these techniques in analog circuits and discusses the future challenges in both fault diagnosis and testing.