Using boundary scan test to test random access memory clusters
M. Muris, A. Biewenga · 2002
Interconnects inside clusters of random access memories on printed circuit boards can be tested using boundary scan test. This paper makes recommendations regarding the design of clusters, containing either static or dynamic memory devices, allowing for a complete structural test of the cluster. No additional access to the internal interconnects of the cluster is required. Examples of static and dynamic cluster designs are presented illustrating the recommendations.>