LFSROM: Basic Principle and BIST application
Christian Dufaza, Claudine Chevalier · 2002
A built-in self test (BIST) approach wherein the on-chip test pattern generator is basically the combination of a LFSR, on OR/sub 2/ network and a set of multiplexers is described. Given precomputed sequences of deterministic test vectors, it is illustrated by some examples that this LFSROM generator provides data storage performances comparable in quality to a ROM.>