Sensitivity analysis of the metric based test selection
Jadranka A. Curgus, Son T. Vuong, Jinsong Zhu · 1997
In our earlier work [7, 3], we introduced a novel concept of test distance and an effective multi-pass metric-based method of test selection for communication protocols. The main weight of the method rests on the concept of test distance , which forms the basis of a metric definition to guide the convergent test selection process. In this paper, we discuss a sensitivity analysis of this metric based test selection method. We present empirical results regarding the sensitivity of common metric definitions to various aspects of protocols such as recursion levels, multiple concurrent connections, transition or event patterns.