High performance CMOS array with an embedded test structure
K. Pierce, R. Lipp, E. Chan, Thin Sek Wong · 2002
A compacted array containing the CrossCheck embedded test structure has been jointly developed by LSI Logic Corporation and CrossCheck Technology. A test device was built and the embedded test structure was found to successfully collect internal logic node values without disturbing internal logic values. The CrossCheck test structure used a minimum of area in the array and had no observable impact on the test chip logic operating speed.>