Test and debug strategy of the PNX8525 Nexperia/sup TM/ digital video platform system chip
Bart Vermeulen, S. Oostdijk, F. Bouwman · 2002
Decreasing feature sizes and increasing customer demand for more functionality have forced design teams to re-use design blocks and application platforms. As a result, re-use of test, design-for-test and design-for-debug for large system chips is becoming increasingly important and increasingly necessary.. In this paper, the test and debug features of the Nexperia/sup TM/ PNX8525 chip are presented. The PNX8525 chip is a large system chip for the consumer electronics market. The impact of core-based testing is discussed, at both the core-level and the top-level, together with the design-for-debug implementation on this multiple clock domain chip.