AC-JTAG: empowering JTAG beyond testing DC nets
Sung Kyu Chung, Sanghyeon Baeg · 2002
Presents the new technology that extends today's JTAG's capability from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support AC interconnection test and to have backward compatibility with EXTEST. It leverages existing application software available within the boundary-scan test industry to promote this technology to the manufacturing floor with minimal impact.