Adapting an SoC to ATE concurrent test capabilities
Rainer G. Dorsch, R.H. Rivera, Hans-Joachim Wunderlich, Mark Fischer · 2003
Concurrent test features are available in SoC testers to increase ATE throughput. To exploit these new features, design modifications are necessary. In a case study, these modifications were applied to the open source LEON SoC platform containing an embedded 32 bit CPU, an AMBA bus, and several embedded cores. The concurrent test of LEON was performed on an SoC tester. The gain in test application time and area costs are quantified and obstacles in the design flow for concurrent test are discussed.