Modular TSC checkers for Bose-Lin and Bose codes
Xrysovalantis Kavousianos, Dimitrios Nikolos · 2003
It is well known that the most common errors in VLSI circuits are unidirectional in nature. Many applications need protection against up to t unidirectional errors, while some others against burst unidirectional errors. Bose-Lin codes are systematic t-unidirectional error detecting codes while Bose codes are burst unidirectional error detecting codes. In this paper we propose a modular method for designing double output checkers for Bose-Lin and Bose codes. The proposed checkers are Totally Self Checking (TSC) with respect to a realistic fault model including stuck-at, transistor stuck-open, transistor stuck-on, resistive bridging faults and breaks. The method is applicable to every code information length and the checkers are very compact and fast.