The use of bit conserving logic in design for testability
B.R. Gribble, J.H. Aylor, S.H. Jones, Barry W. Johnson · 2003
A method of design for testability (DFT) and built-in self-test (BIST) based upon bit conserving logic ((BCL) is presented. This method is completely general and requires only two function-independent input test vectors for 100% testing of single stuck-at faults regardless of the size of complexity of the circuit. Both combinational and sequential circuits can be tested with no scan techniques.>