UBIST version of the SYCO's control section compiler
K. Torki, M. Nicolaidis, Ahmed A. Jerraya, Bernard Courtois · 2003
The authors describe a design-for-testability strategy for the SYCO control section compiler (CPC). The SYCO CPC translates high-level descriptions into mask-level specification for hierarchical control sections, which are composed of a stack of control section slices, each one organized around a programmable logic array. The proposed design-for-testability scheme is called UBIST (unified built-in self-test) and ensures a high quality for all tests needed for integrated circuits (i.e. online and offline tests). The authors elucidate the concept of UBIST and show how to modify SYCO CPC data structure and its automatic layout synthesizer to generate UBIST control sections automatically and efficiently.>