Integration of IEEE STD.11149.1 and mixed-signal test architectures
D.J. Cheek, Ramaswami Dandapani · 2002
It is shown that the TMS pin of IEEE Std. 1149.1 can also be-used for providing stimulus during analog measurements using the architectures of [Park93] and [Lu94]. This results in the saving of one test pin for these architectures. Simulation results show that mixed-signal testing can be safely performed using the new approach without compromising the effectiveness of the approaches of [Park93] and [Lu94].