Meeting the Test Challenges of the 1 Gbps Parallel RapidIO® Interface with New Automatic Test Equipment Capabilities
D. Aaberge, K. Mockler, D. Van Dinh, R. Belleau, T. Donovan, R. Hewlitt · 2005
This paper describes an approach to testing the 1 Gbps Parallel RapidIO/spl reg/ interface specifications. The unique test requirements for this bus require the application of new test techniques as well as new ATE capabilities. ATE performance attributes important for parallel source-synchronous buses will be identified and presented with methods to measure these attributes.