Configurable two-dimensional linear feedback shifter registers for deterministic and random patterns [logic BIST]
C.-I.H. Chen, Kiran George · 2003
A new deterministic built-in self-test (BIST) approach to generate a set of pre-computed test patterns followed by random test patterns is proposed. Given a set of precomputed test patterns, a simple test generator based on configurable two-dimensional (2D) linear feedback shift registers (LFSR) is synthesized to generate the given test set. This configurable 2D LFSR based test generator generates: 1) a deterministic sequence of test patterns for random-pattern-resistant faults, and then 2) random test patterns for random-pattern-detectable faults. The configurable 2D LFSR test generator can be adopted in two basic BIST execution options: test-per-clock (parallel BIST) and test-per-scan (serial BIST).