DESIGN OF A MICROPROGRAM CONTROL UNIT WITH CONCURRENT ERROR DETECTION.
Clinton Yu Wong, W.K. Fuchs, Jacob A. Abraham, Edward S. Davidson · Illinois Digital Environment for Access to Learning and Scholarship (University of Illinois at Urbana-Champaign) · 1983
The authors present an integrated approach to the design and implementation of a microprogram control unit (MCU) with comprehensive concurrent error detection (CED) capability. The AM2910 microprogram sequencer is used as a functional model. It has been shown that the classical stuck-at fault model alone is not sufficient to describe failures in VLSI circuits. Various potential failures in the MCU are discussed and a functional level fault model is used, namely, arbitrary failures in single copies of functional units and unidirectional errors in stored words and on control or data transfer buses. Based on this fault model, Berger Coding (BERG61) and duplication techniques are used to provide the error-detecting capability of the MCU. 16 references.