Experimental results on aliasing errors in circular BIST design
R.D. Kothari, Dong Sam Ha · 2002
Although many analyses on aliasing errors have been reported, no definite experiments has been reported on aliasing probabilities under built-in self-test (BIST) environment. In this paper, the authors present experimental results on the aliasing probability of the circular BIST design technique. Among 23 ISCAS89 benchmark circuits experimented, aliasing errors were detected in only 2 of the 23 circuits at the end of the application of 2000 clocks. However, 11 circuits encountered aliaising errors during the period of the 2000 clocks. The average and maximum aliasing probability observed in an 8 and a 16 bit signature analysis registers for the 23 circuits are also presented. No aliasing errors were observed for a 32 bit signature analysis register.>