Circuits for pseudoexhaustive test pattern generation
Laung‐Terng Wang, Edward J. McCluskey · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988
Implementation methods based on cyclic codes are presented for pseudoexhaustive testing of combinational logic networks with restricted output dependency. A modified linear-feedback shift register (LFSR) is used to generate exhaustive test patterns for every output of the circuit. All detectable, combinational faults (those that do not change a combinational circuit to a sequential circuit) in each cone of logic driving a single output are guaranteed to be detected. Examples indicate that LFSRs based on cyclic codes have lower hardware cost and shorter or comparable test lengths than other approaches. These test-pattern generators are well suited to applications where short testing time, low hardware overhead, and 100% single-stuck-at fault coverage are required.>