Using linear cellular automata with memory layer in BIST
Monica Dascălu, Eduard Franți, M. Miloiu · 2002
Built-In Self Test is a basic requirement for high performances microelectronic products. The design of good BIST structures and schemes is a discipline by itself. This paper presents the features of cellular automata chat recommend their use in BIST, especially as test pattern generators. Different pseudo-random sequence generators with cellular automata are presented, together with their properties.