Automatic test chip and test program generation: an approach to parametric test computer-aided design
Thibault Douville, J.P. Jeanne, J.L. Leclercq, D. Caloud, L. Zangara · 2003
For each new CMOS technology, the design of the associated test chip and test program requires much effort. To reduce this design cycle the authors have developed an integrated test chip and test program generation system, which generates automatically and concurrently all the tools necessary for parametric data acquisition, and optimizes the test structure design according to the foreseen electrical characteristics. The authors have defined standard design rules that are independent of any technology using the method of the mnemonics. The goal was to speed up the generation of a test chip, allowing the development and stabilization of double-metal double-polysilicon CMOS technologies. A test chip layout generator, MODULE, and a test program generator, PARAM, were developed. With both these generators it is possible, for a given CMOS technology described by its design and electrical rule packages, to generate automatically and concurrently the test structures, modules, and programs necessary for parametric data acquisition.>