Multi-GHz interface devices should be tested using external test resources
Takahiro J. YAMAGUCHI · 2003
We have to test multi-GHz interface devices by measuring timing jitter. This provides us with a shortcut to reduce test time. Furthermore, we can now measure the jitter transfer function and jitter tolerance simultaneously. External test resources such as ATE or similar instruments should be allocated for testing such high-speed I/Os. After good correlation between measured values by an ATE and those of an on-chip circuit has been establishing, some tests could be implemented on-chip.