The Weighted Syndrome Sums Approach to VLSI Testing
Barzilai, Savir, Markowsky, Smith · IEEE Transactions on Computers · 1981
With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence.