Using iterative test generation in a PC based guided probe testing system
Kenneth G. Goad, J.G. Tront, John C. McKeeman · 2003
The model for an automated guided probe implemented on a IBM personal computer-based system is presented. With the addition of a few interface cards and the appropriate software, a PC can be transformed into a tester capable of driving an X-Y prober. Thus existing PC systems can be upgraded to acquire testing capability. An additional benefit of the PC-based system is the ability to do CAD layout of PCBs (printed circuit boards) at the same station. This advantage allows an engineer to test a prototype board during the design stages of a PCB.>