Highly testable Boolean ring logic circuits
U. Kalay, Marek A. Perkowski, D.V. Hall · 2003
In this paper we show how Boolean Ring logic, a group-based logic, leads to a circuit implementation that is highly testable. We develop Boolean Ring based expressions, which we call Generalized-Literal Boolean-Ring Sum-of-Products (GL-BRSOP) and Universal-Literal Boolean-Ring Sum-of-Products (UL-BRSOP) to represent (powers of 2)-valued MVL functions. Our BRSOPs: allow MVL functions to be implemented with vectors of binary AND and EXOR gates; allow the use of a binary logic fault model; and allow a time-multiplexed implementation that is highly testable and uses less redundant circuitry.