Syndrome simulation and syndrome test for unscanned interconnects
Chauchin Su, Shyh-Shen Hwang, Shyh-Jye Jerry Jou, Yuan-Tzu Ting · 2002
In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, fault-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solve the problem as a set covering problem.