Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations
Thijs Vogels, Th. Zanon, Rao Desineni, R. D. Blanton, Wojciech P. Maly, J. G. Brown, J. E. Nelson, Yuheng Fei, Xiaojing Huang, Padmini Gopalakrishnan, Malvika Mishra, Vyacheslav Rovner, Saurabh K Tiwary · 2008
Diagnosis algorithms for integrated circuits (ICs) are typically developed and evaluated using a limited number of logic-level models of defect behaviors. However, it is well-known that real IC defects exhibit behavior well outside these models. Consequently, the utility of IC diagnosis methodologies may be uncertain. In this paper, a simulation-based benchmarking strategy is developed that uses circuit-level models to describe the complex nature of real defects. Specifically, we have proposed a simple yet powerful strategy using a small circuit and a set of bounded deformations (i.e., defects) for measuring the effectiveness of diagnosis techniques. Evaluation of several simple and commercial diagnosis algorithms indicates that this form of diagnosis benchmarking is viable. 1.