High-speed interface testing [LSI]
Masafumi Suzuki, Ryota Shimizu, N. Naka, Kazuyuki Nakamura · 2002
One big problem in the high-speed interface macro development and the support for the high-speed network business which Fujitsu held, was solved by the loop back LSI testing technique. In future, Fujitsu want to advance the examination of higher quality and further efficiency improvement for ATE cost reduction.