A new approach for testing MOS circuits based on large defects
Reinhard Rauscher, Bernd Schütz · 2003
This work presents a new approach for testing MOS circuits. The proposed model is based on the idea that for each kind of fault a dedicated set of test patterns can be generated. In particular for the case of large defects, we defined a dedicated fault model and suggested an approach for detecting such defects with a minimum amount of patterns.