I/sub DDQ/ testing and defect classes-a tutorial
Jerry M. Soden, Charles F. Hawkins · 2002
I/sub DDQ/ testing of CMOS ICs is a technique for production quality and reliability improvement, design validation, and failure analysis. The origin and basic concepts of I/sub DDQ/ testing are reviewed. The relationship of I/sub DDQ/ testing to other test methods is considered in the context of the whole IC life cycle from design, fabrication, and test through end use. A comprehensive test strategy is described that uses defect classes based on defect electrical properties rather than traditional fault models.