A current sensor for on-chip, non-intrusive testing of RF systems
Andrea Soldo, A. Gopalan, P.R. Mukund, Martin Margala · 2004
This paper discusses design of a current sensor suitable for on-chip testing of RF circuits. The proposed sensor detects supply current (Idd) variations, with minimal impact on the circuit performance. Bandwidth of the circuit is 3.4 GHz, with a constant gain of 31.7 dB. The sensor has been implemented in IBM-6RF, 0.25 /spl mu/ CMOS technology, with 2.5 V power supply and it offers the low real estate overhead and high dynamic range required for this application.