Design in fault isolating of ternary cellular arrays using ternary decision diagrams
Naotake Kamiura, Hidetoshi Satoh, Yutaka Hata, K. Yamato · 2002
This paper proposes a method to design ternary cellular arrays with high testability. In it, stuck-at faults of switch cells are assumed. Testing of the array composed of switch cells can be executed easily because of the regular structure of the array. Moreover, if faulty cell is identified we can isolate the faulty cell from the remaining cells. The ternary functions represented by Ternary Decision Diagrams (TDD's) are realized by mapping the TDD's to the cellular arrays directly. Proposed arrays are more advantageous than ternary PLA's for their sizes in realizations of symmetric functions and are also useful for the realizations of multiple-output functions.>