Minimum test sets for locally exhaustive testing of combinational circuits with five outputs
Tokumi Yokohira, T. Shimizu, Hiroyuki Michinishi, Y. Sugiyama, Tatsuki Okamoto · 2002
In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.>