An ASIC level BIST implementation for system level testing
Charles E. Stroud, Robert F. Shaw · 2002
The architecture and operation of a built-in self-test (BIST) implementation at the ASIC level for use at manufacturing unit level testing and system diagnostics is described. Analysis of this BIST approach is given in terms of area overhead, fault coverage, reduction in manufacturing testing costs, and reduction in system diagnostic execution time.>