BIST architectures selection based on behavioral testing
Giuseppe Biasoli, Fabrizio Ferrandi, Alessandro Fin, Franco Fummi, Donatella Sciuto · 2002
BIST techniques have been widely explored to create the best performing self-testing architecture. Their success depends on the type of test pattern required by the circuit under test. The main goal of the paper is to show a methodology, based on behavioral information, to identify the best suited BIST architecture for a given circuit under test. LFSR-based architectures for behavioral test sequences, providing a high stuck-at fault coverage, have been explored and evaluated.